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DFT (Design for Testability) Services

Optimize Your DFT Strategy for Efficient VLSI Design With Us

In today’s rapidly evolving semiconductor industry, ensuring high-quality and defect-free chips is crucial. Design for Testability (DFT) plays a vital role in optimizing the testing process of integrated circuits (ICs), improving fault detection, and reducing manufacturing costs. Our expert DFT services help you enhance test coverage, minimize time-to-market, and ensure a robust VLSI design.
DFT is a specialized methodology that integrates testability features into a chip’s design, making it easier to identify and diagnose faults post-manufacturing. It involves the implementation of test structures such as scan chains, Built-In Self-Test (BIST), and Automatic Test Pattern Generation (ATPG) techniques to improve fault coverage. By adopting DFT methodologies, companies can reduce costly debugging, enhance yield, and ensure a seamless production process.
It involves the implementation of test structures such as scan chains, Built-In Self-Test (BIST), and Automatic Test Pattern Generation (ATPG) techniques to improve fault coverage. By adopting DFT methodologies, companies can reduce costly debugging, enhance yield, and ensure a seamless production process.

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Our DFT Services

We provide end-to-end DFT solutions customized to your unique design requirements. Our expertise includes scan insertion, ATPG, BIST, boundary scan, and fault simulation to enhance test coverage, reduce costs, and optimize silicon yield. With industry-leading tools and methodologies, we ensure efficient and reliable testability for ASIC, SoC, and FPGA designs, helping you achieve faster time-to-market and superior product quality.

  • Scan Insertion and Compression
  • ATPG (Automatic Test Pattern Generation) and Fault Simulation
  • Memory BIST (MBIST) and Logic BIST (LBIST) Implementation
  • JTAG and Boundary Scan (IEEE 1149.x)
  • DFT Rule Checking, Validation, and Debugging
  • Timing Constraints, Synthesis, and Static Timing Analysis (STA) for Testability
  • Power-Aware DFT and Low-Power Test Strategies

Scan Insertion and Compression

Scan Insertion and Compression are essential Design for Testability (DFT) techniques that enhance the testability of complex VLSI designs while reducing test time and cost. These techniques ensure high fault coverage by embedding scan chains into the design, allowing for effective detection and diagnosis of manufacturing defects.

  • Feature extraction, test plan creation, and coverage planning based on UVM
  • Complete verification environment bring-up from scratch and flow
  • Setup of Palladium, Zebu, and FPGA verification environments
  • Gate-Level Simulation (GLS) and UPF flow setup
  • X propagation clean-up and GLS sign-off
  • Expertise in multi-core SoC architectures, including ARM Cortex M/R series, RISC-V, and ARC cores
  • Experience with complex IPs such as USB, PCIe, Ethernet, Graphics, MIPI, and memory controller subsystems
  • BFM (Bus Functional Model) generation
  • UVM, OVM, SV, C, and C++ verification approaches from scratch

Power-Aware DFT and Low-Power Test Strategies

As semiconductor designs become more power-sensitive, integrating power-aware Design for Testability (DFT) techniques is essential for ensuring efficient testing without significantly impacting power consumption. Traditional DFT methodologies often overlook power constraints, leading to excessive switching activity, increased heat dissipation, and potential reliability issues during test execution. Our Power-Aware DFT and Low-Power Test Strategies address these challenges by optimizing testability while maintaining power efficiency.

  • Low-Power Scan Insertion – Implementing scan chains that minimize power overhead during shift and capture cycles.
  • Power-Gated Testing – Enabling efficient testing of power domains with minimal impact on leakage and dynamic power.
  • Clock Gating Aware ATPG – Generating test patterns that respect clock-gated regions to prevent excessive power spikes.
  • Multi-Voltage Domain Testing – Ensuring seamless DFT implementation across multiple power domains using UPF-based methodologies.

DFT Rule Checking, Validation, and Debugging

Ensuring robust Design for Testability (DFT) implementation requires strict adherence to DFT rules, thorough validation, and efficient debugging. Any violations in scan insertion, ATPG, or power-aware test implementation can lead to reduced fault coverage, increased test costs, or functional failures. Our DFT Rule Checking, Validation, and Debugging services help identify and resolve design rule violations early in the development cycle, ensuring a high-quality testable design.

  • Scan Chain Integrity Verification – Ensuring proper connectivity, order, and functionality of scan chains.
  • Test Mode and Bypass Validation – Checking the correctness of test modes, isolation, and scan bypass paths.
  • Clock and Reset Rule Compliance – Verifying that scan clocks and resets follow industry-standard DFT guidelines.
  • ATPG and Fault Coverage Analysis – Running comprehensive fault simulations to maximize defect detection.